ATOMIC FORCE MICROSCOPE

Activity 1

atomic interaction

van der waals

coulombic interaction

working principle

surface sensing

detection method

imaging

type of cantilever

application

Subtopic

interaction of the tip with the surface of sample

type of operation mode

contact

non-contact

tapping

any outsider effect on image formed?

structure of tip

orientation of tip

total charge density

how?

rotations of lattice matched

hot lattice matched to the sample

two or more atoms along one direction

image artifacts

probes

scanners

image processing

vibrations

Subtopic

type of interaction

electrostatic force microscopy

detect defect on silicon surface

electronic properties

characterizing surface electrica propertiesl

magnetic force microscopy

magnetization reversal

thin films

nanoparticles

possible interaction

deflection of the lever

impact on image of AFM

how did the interaction provide the sample’s surface
information?