1.6 KRUSS SFT Approach

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bios

ESME GOMEZにより

CX inside Zara stores

Maria Ines Vaccariにより

Resources for Measurement (Length, Area, and Volume)

Katie George-Mittelstadtにより

Industrial Control Systems Security

MariaEs Martinezにより

1.6 KRUSS SFT Approach

Substances

Custom substances

Licensing

Reporting

Migration based issues

Language based issues

Chart

Big amount of data to display

DevExpress Update

Measurement

TM

Spinning Drop Flexible

Spinning Drop

High Pressure

Ross Miles

Foam

ODM

TVA

Mapping

Double Sessile

Pendant

Sessile

Automation

Navigation

Measurement properties not displayed in Explorer area

Tiles displayed not evenly after measuring process

Migrations

Comparison

Performance affected by ammount of data

Instrument configuration

DSA

Hardware components integration

Firmware, KBus/KBus2, HAL

Import / Export

Data loss

Data sampling

FA

Inconsistencies between set and processed frame rate

Instrument control

Firmware, hardware, HAL

Live view

CPU usage

Codecs

USB drivers