ATOMIC FORCE MICROSCOPE
Activity 4
how did the interaction provide the sample’s surface
information?
possible interaction
impact on image of AFM
deflection of the lever
type of interaction
magnetic force microscopy
nanoparticles
thin films
magnetization reversal
electrostatic force microscopy
characterizing surface electrica propertiesl
electronic properties
detect defect on silicon surface
Activity 3
https://www.mindomo.com/mindmap/cd0c0c40278642caa82bc5834b8a388c
image artifacts
vibrations
image processing
scanners
probes
how?
two or more atoms along one direction
hot lattice matched to the sample
rotations of lattice matched
any outsider effect on image formed?
total charge density
orientation of tip
structure of tip
GROUP 5&6
Activity 2
type of operation mode
tapping
non-contact
contact
interaction of the tip with the surface of sample
application
Subtopic
type of cantilever
Activity 1
working principle
imaging
detection method
surface sensing
atomic interaction
coulombic interaction
